14

Paramagnetic defects in silicon/silicon dioxide systems

Year:
1976
Language:
english
File:
PDF, 656 KB
english, 1976
20

Matrix ENDOR Linewidths of Trapped Electrons in Glassy Matrices at 77°K

Year:
1972
Language:
english
File:
PDF, 701 KB
english, 1972
23

Electron Beam and X-Ray Resist Behavior of Poly(methacrylonitrile)

Year:
1979
Language:
english
File:
PDF, 608 KB
english, 1979
34

Handbook of VLSI Microlithography || Resist Technology—Design, Processing, and Applications

Year:
2001
Language:
english
File:
PDF, 4.33 MB
english, 2001